2010; Physical and Mathematical Sciences, 45(1 (224): 63–67
Shared with The Gufo
METHOD FOR MEASURING THICKNESS OF THIN OBJECTS WITH A NANOMETER RESOLUTION, BASED ON THE SINGLE-LAYER FLAT-COIL-OSCILLATOR METHOD
Received: 2025-02-23 · Published: 2010-10-21
© 2010 The Author(s) and the original publisher.
This work is licensed under a Creative Commons Attribution 4.0 International License.
Shared article.
- Original title
- METHOD FOR MEASURING THICKNESS OF THIN OBJECTS WITH A NANOMETER RESOLUTION, BASED ON THE SINGLE-LAYER FLAT-COIL-OSCILLATOR METHOD
- Author
- S.G. Gevorgyan
- Published
- 2010-10-21
- Licence
- Creative Commons Attribution 4.0 International
End of article
